Microscope VK-X260K Keyence
Microscope VK-X260K Keyence

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VK-X260K Keyence Microscope

Manufacturer

Keyence

Country

Japan

Name

VK-X260K

Type

Microscope

Stock availability:

On request

Price: On request

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Specifications VK-X260K

If you are inspecting Keyence VK-X260K , make contact with FAMAGA, the world's the best provider of manufacturing equipment. Our company has worked for more than ten years - these are years of experience, which are described in the quality of goods and particular attention to each buyer. We praise everyone, who collaborated with us - thus, our regular purchasers get the most desirable purchase conditions and discounts on the machine made streamlined equipment market. At this moment, there are more than 3500 such purchasers, and we constantly arrange new agreements. More than 700 transactions are made per day, because FAMAGA delivers all over the globe . A well-shaped logistics chains and a partnership network allow us to ship our goods anywhere in the globe as soon as possible without damaging product quality.

A special source of repute for FAMAGA is its personnel, each of whom contributes to our work. We call into our team only professionals, who already have experience in the range of factory-made equipment.

All items from FAMAGA are affirmed - we are responsible for the cause of our work. Nowadays, more than 10 million units of products have been supplied, and this bulk is amounting every day. We are pleased that customers choose FAMAGA again and again, and we are glad to make more exceptional and technologically modern industrial equipment so as stay in control.

To request or book, contact us or write to the online chat on our official website. You can also dispatch a list of the desirable equipment to the email of corporation - we will contact you ourselves with a prepared commercial proposal from FAMAGA.

Features VK-X260K

Measurement unit
Model VK-X260K
Total magnification Up to 28000?*1
Field of view (minimum range) 11 to 5400 µm
Frame rate Laser measurement speed 4 to 120 Hz, 7,900 Hz*2
Measurement principles Optical system Pinhole confocal optical system
Height measurement Linear scale 0.5 nm
Repeatability ? 20?: 40 nm, 50?: 12 nm, 150?: 12 nm *3
Memory for Z-axis measurement 14 million steps
Accuracy 0.2 + L/100 µm or better*4*5
Width measurement Display resolution 1 nm
Repeatability 3? 20?: 100 nm, 50?: 40 nm, 150?: 20 nm*3
Accuracy ±2%*3
XY stage configuration Manual: Operating range 70 mm?70 mm
Motorized: Operating range 50 ? 50 mm, 100 ? 100 mm*6
Observation Maximum capture resolution 3072?2304
Weight Microscope Approx. 26 kg (without sensor head, approx. 10 kg)
Controller Approx. 11 kg
*1 With a 23-inch monitor. *2 At maximum speed when using a combination of measurement mode/measurement quality/lens magnification. When the line scan is within a measurement pitch of 0.1 µm. *3 When measuring the reference scale with the 20? objective lens (or higher) at an ambient temperature of 20 ± 2 °C. With the exception of the VK-X120/X130 with the 100? objective lens. *4 When measuring the reference scale with the 20x objective lens (or higher) at an ambient temperature of 20 ±2 °C. With the e x ception of the VK-X120/X130 with the 100x objective lens. *5 L = Vertical measurement length in µm *6 With a motorised stage.