Microscope VK-X250K Keyence
Microscope VK-X250K Keyence

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VK-X250K Keyence Microscope

Manufacturer

Keyence

Country

Japan

Name

VK-X250K

Type

Microscope

Stock availability:

On request

Price: On request

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Specifications VK-X250K

If you are looking for Keyence VK-X250K , make contact with FAMAGA, the world's leading supplier of industrial equipment. Our company has existed for more than ten years - these are ages of experience, which are described in the quality of goods and personalseparate attention to each client. We praise everyone, who cooperated with us - thus, our regular customers receive the most desirable purchase terms and discounts on the machine made streamlined equipment market. Today, there are more than 3500 such customers, and we constantly form new agreements. More than 700 affairs are settled per day, because FAMAGA delivers all over the globe . A well-developed logistics system and a partnership network guide us to deliver our items anywhere in the globe on-time without compromising product quality.

A specific source of pride for FAMAGA is its employees, each of whom contributes to our work. We accept into our team only specialists, who already have experience in the range of factory-made equipment.

All products from FAMAGA are guaranteed - we are responsible for the cause of our work. Nowadays, more than 10 million units of products have been supplied, and this bulk is growing every day. We are pleased that consumers choose FAMAGA again and again, and we strive to make more exceptional and technologically modern industrial equipment so as stay in control.

To consult or book, contact us or send a message to the online chat on our official website. You can also dispatch a list of the desirable equipment to the email of corporation - we will contact you ourselves with a prepared commercial proposal from FAMAGA.

Features VK-X250K

Controller
Model VK-X250K
Total magnification Up to 28000?*1
Field of view (minimum range) 11 to 5400 µm
Frame rate Laser measurement speed 4 to 120 Hz, 7,900 Hz*2
Measurement principles Optical system Pinhole confocal optical system
Height measurement Linear scale 0.5 nm
Repeatability ? 20?: 40 nm, 50?: 12 nm, 150?: 12 nm *3
Memory for Z-axis measurement 14 million steps
Accuracy 0.2 + L/100 µm or better*4*5
Width measurement Display resolution 1 nm
Repeatability 3? 20?: 100 nm, 50?: 40 nm, 150?: 20 nm*3
Accuracy ±2%*3
XY stage configuration Manual: Operating range 70 mm?70 mm
Motorized: Operating range 50 ? 50 mm, 100 ? 100 mm*6
Observation Maximum capture resolution 3072?2304
Weight Microscope Approx. 26 kg (without sensor head, approx. 10 kg)
Controller Approx. 11 kg
*1 With a 23-inch monitor. *2 At maximum speed when using a combination of measurement mode/measurement quality/lens magnification. When the line scan is within a measurement pitch of 0.1 µm. *3 When measuring the reference scale with the 20? objective lens (or higher) at an ambient temperature of 20 ± 2 °C. With the exception of the VK-X120/X130 with the 100? objective lens. *4 When measuring the reference scale with the 20x objective lens (or higher) at an ambient temperature of 20 ±2 °C. With the e x ception of the VK-X120/X130 with the 100x objective lens. *5 L = Vertical measurement length in µm *6 With a motorised stage.