Microscope VK-X160K Keyence
Microscope VK-X160K Keyence

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VK-X160K Keyence Microscope

Manufacturer

Keyence

Country

Japan

Name

VK-X160K

Type

Microscope

Stock availability:

On request

Price: On request

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Specifications VK-X160K

If you are seeking Keyence VK-X160K , make contact with FAMAGA, the world's foremost company of mechanized equipment. Our company has operated for more than ten years - these are cycles of experience, which are described in the quality of goods and private attention to each orderer. We praise everyone, who engaged with us - thus, our regular consumers pick up the most desirable purchase forms and discounts on the machine made streamlined equipment market. At this time, there are more than 3500 such consumers, and we constantly make new agreements. More than 700 proceedings are resolved per day, because FAMAGA delivers all over the globe . A well-built logistics network and a partnership network let us to dispatch our units anywhere in the globe promptly without disreputing product quality.

A particular source of dignity for FAMAGA is its team members, each of whom contributes to our work. We request into our team only experts, who already have experience in the range of factory-made equipment.

All outcomes from FAMAGA are verified - we are responsible for the cause of our work. Nowadays, more than 10 million units of products have been supplied, and this bulk is ascending every day. We are pleased that purchasers choose FAMAGA again and again, and we are happy to make more exceptional and technologically modern industrial equipment so as stay in control.

To get some advice or book, contact us or write a message to the online chat on our official website. You can also dispatch a list of the desirable equipment to the email of corporation - we will contact you ourselves with a prepared commercial proposal from FAMAGA.

Features VK-X160K

Measurement unit
Model VK-X160K
Total magnification Up to 19200?*1
Field of view (minimum range) 16 to 5400 µm
Frame rate Laser measurement speed 4 to 120 Hz, 7,900 Hz*2
Measurement principles Optical system Pinhole confocal optical system
Height measurement Linear scale 5 nm
Repeatability ? 20?: 40 nm, 50?: 20 nm, 100?: 20 nm *3
Memory for Z-axis measurement 1.4 million steps
Accuracy 0.2 + L/100 µm or better*4*5
Width measurement Display resolution 10 nm
Repeatability 3? 20?: 100 nm, 50?: 50 nm, 100?: 30 nm*3
Accuracy ±2%*3
XY stage configuration Manual: Operating range 70 mm?70 mm
Motorized: Operating range 50 ? 50 mm, 100 ? 100 mm*6
Observation Maximum capture resolution 3072?2304
Weight Microscope Approx. 25 kg (without sensor head, approx. 8.5 kg)
Controller Approx. 11 kg
*1 With a 23-inch monitor. *2 At maximum speed when using a combination of measurement mode/measurement quality/lens magnification. When the line scan is within a measurement pitch of 0.1 µm. *3 When measuring the reference scale with the 20? objective lens (or higher) at an ambient temperature of 20 ± 2 °C. With the exception of the VK-X120/X130 with the 100? objective lens. *4 When measuring the reference scale with the 20x objective lens (or higher) at an ambient temperature of 20 ±2 °C. With the e x ception of the VK-X120/X130 with the 100x objective lens. *5 L = Vertical measurement length in µm *6 With a motorised stage.